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v5.0-dev
esp-idf/components/fatfs
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Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout 
Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742
2021-08-25 19:04:34 +08:00
..
diskio
Whitespace: Automated whitespace fixes (large commit)
2020-11-11 07:36:35 +00:00
port
Whitespace: Automated whitespace fixes (large commit)
2020-11-11 07:36:35 +00:00
src
fatfs: Fix some memory leak issues by coverity static analyzer.
2021-01-25 03:37:47 +00:00
test
vfs/fatfs: fix failed tests by increasing timeout
2021-08-25 19:04:34 +08:00
test_fatfs_host
host tests: add missing header files for compiling host tests
2021-07-20 17:44:20 +08:00
vfs
fatfs: Fix some memory leak issues by coverity static analyzer.
2021-01-25 03:37:47 +00:00
CMakeLists.txt
sdspi: support crc16_be for esp32s2
2020-02-12 15:15:46 +08:00
component.mk
fatfs: create separate ffsystem.c for host side testing
2019-06-25 23:07:07 +08:00
Kconfig
docs: added some fast-seek documentation to the fatfs.rst
2020-11-06 13:18:16 -03:00