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v3.3.3
esp-idf/components/driver/test
History
Michael (XIAO Xufeng) c9edf16376 mcpwm: decrease test time
cherry-pick 538540ce
2020-02-21 22:39:12 +08:00
..
include/test
spi: add new test for timing and mode
2019-01-26 00:10:41 +08:00
param_test
…
CMakeLists.txt
…
component.mk
…
test_adc2.c
…
test_common_spi.c
spi: add new test for timing and mode
2019-01-26 00:10:41 +08:00
test_gpio.c
bugfix(GPIO): Fixed the bug that GPIO enables interrupts on one core,
2019-08-06 03:20:11 +00:00
test_i2c.c
driver: Add uart and i2c UTs to check ticks_to_wait in some functions
2019-10-21 07:32:25 +00:00
test_i2s.c
i2s: test case for variation in apll clock rate
2019-07-04 18:27:12 +05:30
test_ledc.c
…
test_pcnt.c
…
test_pwm.c
mcpwm: decrease test time
2020-02-21 22:39:12 +08:00
test_rmt.c
…
test_sdmmc_sdspi_init.cpp
…
test_sigmadelta.c
…
test_spi_master.c
unit-test-app: freertos_compliance config added
2019-06-25 04:33:32 +00:00
test_spi_param.c
test: temp disable spi master slave mode test
2019-03-10 06:21:37 +00:00
test_spi_slave.c
spi_slave: improve the timing configuration
2019-01-26 00:10:41 +08:00
test_timer.c
…
test_uart.c
driver: Add uart and i2c UTs to check ticks_to_wait in some functions
2019-10-21 07:32:25 +00:00
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