Michael (XIAO Xufeng) 337b1df430 esp_flash: add unit test for external flash and QE toggling ...

Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.

2019-11-21 12:26:15 +08:00

..

assign-test.yml

CI: use include to split large CI config file

2019-07-03 16:59:50 +08:00

build.yml

tools: update Windows installer build script

2019-10-18 11:10:41 +02:00

check.yml

Handle deprecated values in sdkconfig.defaults

2019-10-03 10:13:42 +02:00

deploy.yml

CI: use include to split large CI config file

2019-07-03 16:59:50 +08:00

host-test.yml

Fix error code collision and CI check

2019-09-03 08:07:16 +02:00

target-test.yml

esp_flash: add unit test for external flash and QE toggling

2019-11-21 12:26:15 +08:00