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c19106876cf7247232ba300cfda1338c751222ac
esp-idf
/
components
/
driver
/
test
History
Ivan Grokhotkov
13d9c483b3
Merge branch 'bugfix/i2s_apll_clock_fix' into 'master'
...
driver/i2s: fix apll_clock_rate for different sample rates See merge request
idf/esp-idf!5159
2019-06-28 03:49:11 +08:00
..
include
/test
…
param_test
…
CMakeLists.txt
components: use new component registration api
2019-06-21 19:53:29 +08:00
component.mk
…
test_adc2.c
…
test_common_spi.c
global: move the soc component out of the common list
2019-04-16 13:21:15 +08:00
test_gpio.c
…
test_i2c.c
Merge branch 'bugfix/ticks_to_wait_for_uart_and_i2c' into 'master'
2019-06-11 08:41:44 +08:00
test_i2s.c
i2s: test case for variation in apll clock rate
2019-06-20 16:40:58 +00:00
test_ledc.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_pcnt.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_pwm.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_rmt.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_sdmmc_sdspi_init.cpp
…
test_sigmadelta.c
…
test_spi_master.c
spi: multichip support
2019-06-20 10:38:52 +08:00
test_spi_param.c
…
test_spi_sio.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_spi_slave.c
Rename Kconfig options (components/esp32)
2019-05-21 09:09:01 +02:00
test_timer.c
…
test_uart.c
driver: Add uart and i2c UTs to check ticks_to_wait in some functions
2019-06-05 10:38:23 +08:00