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4c68212c8feaecb46368113d10b7f053ee3d43c2
esp-idf/components/driver/test
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xiehang 4c68212c8f esp_wifi: Modify ESP_IF_WIFI_STA to WIFI_IF_STA
2021-01-27 14:59:25 +08:00
..
include/test
spi: add new test for timing and mode
2019-01-26 00:10:41 +08:00
param_test
test: add new test framework for different configurations
2019-01-26 00:10:41 +08:00
CMakeLists.txt
components: use new component registration api
2019-06-21 19:53:29 +08:00
component.mk
test: add new test framework for different configurations
2019-01-26 00:10:41 +08:00
test_adc2.c
esp_wifi: Modify ESP_IF_WIFI_STA to WIFI_IF_STA
2021-01-27 14:59:25 +08:00
test_common_spi.c
global: move the soc component out of the common list
2019-04-16 13:21:15 +08:00
test_gpio.c
bugfix(GPIO): Fixed the bug that GPIO enables interrupts on one core,
2019-07-29 11:09:07 +00:00
test_i2c.c
Merge branch 'bugfix/ticks_to_wait_for_uart_and_i2c' into 'master'
2019-06-11 08:41:44 +08:00
test_i2s.c
i2s: test case for variation in apll clock rate
2019-06-20 16:40:58 +00:00
test_ledc.c
driver: Remove features deprecated pre-IDF V4.0
2019-09-19 18:47:15 +10:00
test_pcnt.c
driver(ledc): fixed ledc clock selection bug for release/v4.0
2019-08-12 17:16:52 +08:00
test_pwm.c
driver: fix gpio pin_bit_mask truncation in sdspi_host and others
2020-04-02 23:38:17 +02:00
test_rmt.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_sdmmc_sdspi_init.cpp
sdmmc, sdspi: fix initializers to be C++-compatible, add test
2018-04-23 14:35:13 +08:00
test_sigmadelta.c
test: driver/sigmadelta test case
2018-06-13 10:15:06 +08:00
test_spi_master.c
driver test: disable the spi master performance test when psram is used
2020-07-21 05:43:45 +00:00
test_spi_param.c
Merge branch 'test/spi_sio_test' into 'master'
2019-03-13 15:15:43 +08:00
test_spi_sio.c
all: Using xxx_periph.h
2019-06-03 14:15:08 +08:00
test_spi_slave.c
Rename Kconfig options (components/esp32)
2019-05-21 09:09:01 +02:00
test_timer.c
test: components/driver: timer case
2018-06-13 01:39:07 +00:00
test_uart.c
ci: temporarily disable RS485 related tests
2020-07-08 06:31:29 +02:00