Files
esp-idf/components/nvs_flash/test
Ivan Grokhotkov 413f2c00f6 nvs_flash: introduce write failures after each word written
Previously the test bench would check failure recovery by introducing error after each write operation.
This makes checks a bit more extensive (and much longer) by failing after every word written. Surprisingly, this change didn't expose any bugs.
2016-10-31 19:17:25 +08:00
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2016-08-17 23:08:22 +08:00
2016-08-17 23:08:22 +08:00
2016-08-17 23:08:22 +08:00