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unit-test-app: support multiple devices test cases:

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current unit-test-app don't support test components need to communicate
with each other (like GPIO, SPI ...). Now we add multiple devices mode
to unit test app, support writing and running test with multiple DUTs.

please refer to `docs/api-guides/unit-tests.rst` for detail.
This commit is contained in:
houchenyao
2017-11-30 19:31:51 +08:00
committed by He Yin Ling
parent 582b731c23
commit 7a31b93fa3
5 changed files with 299 additions and 29 deletions
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93
docs/api-guides/unit-tests.rst
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@@ -3,8 +3,8 @@ Unit Testing in ESP32
ESP-IDF comes with a unit test app based on Unity - unit test framework. Unit tests are integrated in the ESP-IDF repository and are placed in ``test`` subdirectory of each component respectively.
Adding unit tests
-----------------
Add normal test cases
---------------------
Unit tests are added in the ``test`` subdirectory of the respective component.
Tests are added in C files, a single C file can include multiple test cases.
@@ -31,6 +31,59 @@ Each `test` subdirectory needs to include component.mk file with at least the fo
See http://www.throwtheswitch.org/unity for more information about writing tests in Unity.
Add multiple devices test cases
-------------------------------
The normal test cases will be executed on one DUT (Device Under Test). Components need to communicate with each other (like GPIO, SPI ...) can't be tested with normal test cases.
Multiple devices test cases support writing and running test with multiple DUTs.
Here's an example of multiple devices test case::
void gpio_master_test()
{
gpio_config_t slave_config = {
.pin_bit_mask = 1 << MASTER_GPIO_PIN,
.mode = GPIO_MODE_INPUT,
};
gpio_config(&slave_config);
unity_wait_for_signal("output high level");
TEST_ASSERT(gpio_get_level(MASTER_GPIO_PIN) == 1);
}
void gpio_slave_test()
{
gpio_config_t master_config = {
.pin_bit_mask = 1 << SLAVE_GPIO_PIN,
.mode = GPIO_MODE_OUTPUT,
};
gpio_config(&master_config);
gpio_set_level(SLAVE_GPIO_PIN, 1);
unity_send_signal("output high level");
}
TEST_CASE_MULTIPLE_DEVICES("gpio multiple devices test example", "[driver]", gpio_master_test, gpio_slave_test);
The macro ``TEST_CASE_MULTIPLE_DEVICES`` is used to declare multiple devices test cases.
First argument is test case name, second argument is test case description.
From the third argument, upto 5 test functions can be defined, each function will be the entry point of tests running on each DUT.
Running test cases from different DUTs could require synchronizing between DUTs. We provide ``unity_wait_for_signal`` and ``unity_send_signal`` to support synchronizing with UART.
As the secnario in the above example, slave should get GPIO level after master set level. DUT UART console will prompt and requires user interaction:
DUT1 (master) console::
Waiting for signal: [output high level]!
Please press "Enter" key to once any board send this signal.
DUT2 (slave) console::
Send signal: [output high level]!
Once the signal is set from DUT2, you need to press "Enter" on DUT1, then DUT1 unblocks from ``unity_wait_for_signal`` and starts to change GPIO level.
Building unit test app
----------------------
@@ -55,7 +108,32 @@ Running unit tests
After flashing reset the ESP32 and it will boot the unit test app.
Unit test app prints a test menu with all available tests.
When unit test app is idle, press "Enter" will make it print test menu with all available tests::
Here's the test menu, pick your combo:
(1) "esp_ota_begin() verifies arguments" [ota]
(2) "esp_ota_get_next_update_partition logic" [ota]
(3) "Verify bootloader image in flash" [bootloader_support]
(4) "Verify unit test app image" [bootloader_support]
(5) "can use new and delete" [cxx]
(6) "can call virtual functions" [cxx]
(7) "can use static initializers for non-POD types" [cxx]
(8) "can use std::vector" [cxx]
(9) "static initialization guards work as expected" [cxx]
(10) "global initializers run in the correct order" [cxx]
(11) "before scheduler has started, static initializers work correctly" [cxx]
(12) "adc2 work with wifi" [adc]
(13) "gpio master/slave test example" [ignore][misc][test_env=UT_T2_1]
(1) "gpio_master_test"
(2) "gpio_slave_test"
(14) "SPI Master clockdiv calculation routines" [spi]
(15) "SPI Master test" [spi][ignore]
(16) "SPI Master test, interaction of multiple devs" [spi][ignore]
(17) "SPI Master no response when switch from host1 (HSPI) to host2 (VSPI)" [spi]
(18) "SPI Master DMA test, TX and RX in different regions" [spi]
(19) "SPI Master DMA test: length, start, not aligned" [spi]
Normal case will print the case name and description. Master slave cases will also print the sub-menu (the registered test function names).
Test cases can be run by inputting one of the following:
@@ -66,3 +144,12 @@ Test cases can be run by inputting one of the following:
- Module name in square brackets to run all test cases for a specific module
- An asterisk to run all test cases
After you select multiple devices test case, it will print sub menu::
Running gpio master/slave test example...
gpio master/slave test example
(1) "gpio_master_test"
(2) "gpio_slave_test"
You need to input number to select the test running on the DUT.