eaw/esp-idf
1
0
Fork 0
Code Issues Packages Projects Releases Wiki Activity

Merge branch 'feature/remove_hspi_macor_on_chips_later_than_s2_v4.3' into 'release/v4.3'

Browse Source 
spi: remove hspi macor on chips later than s2 (v4.3)

See merge request espressif/esp-idf!12956
This commit is contained in:
Michael (XIAO Xufeng)
2021-04-08 09:37:07 +00:00
parent 9f1ae278e0 670b057b04
commit 76ff1724b3
32 changed files with 185 additions and 190 deletions
Download Patch File Download Diff File Expand all files Collapse all files

10
docs/en/api-guides/unit-tests-legacy.rst
View File

@@ -98,7 +98,7 @@ DUT1 console::
Waiting for signal: [dut2 mac address]!
Please input parameter value from any board send this signal and press "Enter" key.
DUT2 console::
DUT2 console::
Send signal: [dut2 mac address][10:20:30:40:50:60]!
@@ -108,7 +108,7 @@ Once the signal is sent from DUT2, you need to input ``10:20:30:40:50:60`` on DU
Multi-stage Test Cases
-----------------------
The normal test cases are expected to finish without reset (or only need to check if reset happens). Sometimes we expect to run some specific tests after certain kinds of reset.
The normal test cases are expected to finish without reset (or only need to check if reset happens). Sometimes we expect to run some specific tests after certain kinds of reset.
For example, we expect to test if reset reason is correct after a wakeup from deep sleep. We need to create a deep-sleep reset first and then check the reset reason.
To support this, we can define multi-stage test cases, to group a set of test functions::
@@ -140,12 +140,12 @@ Change into ``tools/unit-test-app`` directory to configure and build it:
* ``make menuconfig`` - configure unit test app.
* ``make TESTS_ALL=1`` - build unit test app with tests for each component having tests in the ``test`` subdirectory.
* ``make TEST_COMPONENTS='xxx'`` - build unit test app with tests for specific components.
* ``make TEST_COMPONENTS='xxx'`` - build unit test app with tests for specific components.
* ``make TESTS_ALL=1 TEST_EXCLUDE_COMPONENTS='xxx'`` - build unit test app with all unit tests, except for unit tests of some components. (For instance: ``make TESTS_ALL=1 TEST_EXCLUDE_COMPONENTS='ulp mbedtls'`` - build all unit tests exludes ``ulp`` and ``mbedtls`` components).
When the build finishes, it will print instructions for flashing the chip. You can simply run ``make flash`` to flash all build output.
You can also run ``make flash TESTS_ALL=1`` or ``make TEST_COMPONENTS='xxx'`` to build and flash. Everything needed will be rebuilt automatically before flashing.
You can also run ``make flash TESTS_ALL=1`` or ``make TEST_COMPONENTS='xxx'`` to build and flash. Everything needed will be rebuilt automatically before flashing.
Use menuconfig to set the serial port for flashing.
@@ -175,7 +175,7 @@ When unit test app is idle, press "Enter" will make it print test menu with all
(14) "SPI Master clockdiv calculation routines" [spi]
(15) "SPI Master test" [spi][ignore]
(16) "SPI Master test, interaction of multiple devs" [spi][ignore]
(17) "SPI Master no response when switch from host1 (HSPI) to host2 (VSPI)" [spi]
(17) "SPI Master no response when switch from host1 (SPI2) to host2 (SPI3)" [spi]
(18) "SPI Master DMA test, TX and RX in different regions" [spi]
(19) "SPI Master DMA test: length, start, not aligned" [spi]
(20) "reset reason check for deepsleep" [esp32][test_env=UT_T2_1][multi_stage]

2
docs/en/api-guides/unit-tests.rst
View File

@@ -229,7 +229,7 @@ When unit test app is idle, press "Enter" will make it print test menu with all
(14) "SPI Master clockdiv calculation routines" [spi]
(15) "SPI Master test" [spi][ignore]
(16) "SPI Master test, interaction of multiple devs" [spi][ignore]
(17) "SPI Master no response when switch from host1 (HSPI) to host2 (VSPI)" [spi]
(17) "SPI Master no response when switch from host1 (SPI2) to host2 (SPI3)" [spi]
(18) "SPI Master DMA test, TX and RX in different regions" [spi]
(19) "SPI Master DMA test: length, start, not aligned" [spi]
(20) "reset reason check for deepsleep" [{IDF_TARGET_PATH_NAME}][test_env=UT_T2_1][multi_stage]

6
docs/zh_CN/api-guides/unit-tests-legacy.rst
View File

@@ -113,9 +113,9 @@ DUT1 终端::
Waiting for signal: [dut2 mac address]!
Please input parameter value from any board send this signal and press "Enter" key.
DUT2 终端::
DUT2 终端::
Send signal: [dut2 mac address][10:20:30:40:50:60]!
@@ -204,7 +204,7 @@ DUT2 终端::
(14) "SPI Master clockdiv calculation routines" [spi]
(15) "SPI Master test" [spi][ignore]
(16) "SPI Master test, interaction of multiple devs" [spi][ignore]
(17) "SPI Master no response when switch from host1 (HSPI) to host2 (VSPI)" [spi]
(17) "SPI Master no response when switch from host1 (SPI2) to host2 (SPI3)" [spi]
(18) "SPI Master DMA test, TX and RX in different regions" [spi]
(19) "SPI Master DMA test: length, start, not aligned" [spi]
(20) "reset reason check for deepsleep" [esp32][test_env=UT_T2_1][multi_stage]

2
docs/zh_CN/api-guides/unit-tests.rst
View File

@@ -238,7 +238,7 @@ DUT2（slave）终端：
(14) "SPI Master clockdiv calculation routines" [spi]
(15) "SPI Master test" [spi][ignore]
(16) "SPI Master test, interaction of multiple devs" [spi][ignore]
(17) "SPI Master no response when switch from host1 (HSPI) to host2 (VSPI)" [spi]
(17) "SPI Master no response when switch from host1 (SPI2) to host2 (SPI3)" [spi]
(18) "SPI Master DMA test, TX and RX in different regions" [spi]
(19) "SPI Master DMA test: length, start, not aligned" [spi]
(20) "reset reason check for deepsleep" [{IDF_TARGET_PATH_NAME}][test_env=UT_T2_1][multi_stage]

2
docs/zh_CN/api-reference/storage/spi_flash.rst
View File

@@ -8,7 +8,7 @@ SPI Flash API
SPI Flash 组件提供外部 flash 数据读取、写入、擦除和内存映射相关的 API 函数，同时也提供了更高层级的，面向分区的 API 函数（定义在 :doc:`分区表 </api-guides/partition-tables>` 中）。
与 ESP-IDF V4.0 之前的 API 不同，这一版 `esp_flash_*` API 功能并不局限于主 SPI Flash 芯片（即运行程序的 SPI Flash 芯片）。使用不同的芯片指针，您可以通过 SPI0/1 或 HSPI/VSPI 总线访问外部 flash。
与 ESP-IDF V4.0 之前的 API 不同，这一版 `esp_flash_*` API 功能并不局限于主 SPI Flash 芯片（即运行程序的 SPI Flash 芯片）。使用不同的芯片指针，您可以通过 SPI0/1 或 SPI2/SPI3 总线访问外部 flash。
.. note::